IBA-PIXE 2023
The 26th International Conference on Ion Beam Analysis (IBA-2023) and the 18th International Conference on Particle Induced X-ray Emission (PIXE-2023) will take place in Toyama, Japan, from 7 to 13 October 2023.
Conference topics: “Ion Beam Analysis 5.0”
Front line of IBA Technologies
Nano beam, Single-ion impact, Ambient, Multi-Modality, …
Challenges to Novel Applications
Life Science, Archeology / Environment, Solid-Liquid Interface, …
Material Science
Nano Structure, Bio-Materials, Imaging, Ion Modifications, …
New Horizon to IBA
Novel Ion Beam, Machine Learning & Data Fusion, …
More information available at https://ion-beam.jp/IBAPIXE2023/