The Centre National de la Recherche Scientifique (CNRS) is a public organization under the responsibility of the French Ministry of Education and Research. The Centre de recherche sur les Ions, les MAtériaux et la Photonique (CIMAP) is affiliated with CNRS.
Since 1982, the CIMAP (ex-CIRIL) laboratory leads the interdisciplinary research at the GANIL (Grand Accélérateur National d’Ions Lourds or National Large Heavy Ion Accelerator in English) facility. The CIMAP laboratory supports the developments of experiments. For this purpose, it welcomes external users and develops equipment adapted to the proposed experiments (beam lines, irradiation chambers, on-line measurements…).
Interdisciplinary research at GANIL can be defined along different topics whose objective is to study the mechanisms of ion – atom collisions, their consequences on the atomic arrangements, on the physical and chemical properties, no matter what is the atomic arrangement. Also the target can consist of atoms, molecules, clusters, surfaces and materials of all types. This research is mainly focused on the effects of the electronic excitations produced by multi-charged ions at high- or low-velocity.
CIMAP has three main missions: fundamental experimental and theoretical research, user facility for interdisciplinarx research using GANIL ion beams, and commitment in student teaching.
CIMAP’s main areas of competence:
- low-energy ion implantation
Role in RADIATE:
-
- leader of joint research activity task: “High-resolution X-ray detectors” CNRS is combining CIMAP’s expertise of low-energy microbeam optics with INSP’s expertise of X-ray, detectors, multidetector arrangements, and data processing
- providing 1600 hours of transnational access to users at the GANIL facility
CIMAP Ion Implantation / Irradiation:
| Parameter | Description |
|---|---|
| Ion species | H-Bi (middle charged ions,typ. 19+ for Xe) |
| Ion energy | 3 - 30 qkeV |
| Depth range | up to 300 nm |
| Fluence | single ion - 1018 cm-2 |
| Incidence angle | Standard 0° |
| Beam current | fA - nA |
| Sample size | Small pieces (cm2) |
| Temperature | ambiant |
| Special features | Localized implantation (100 nm) |
CIMAP HCI:
| Parameter | Value |
|---|---|
| Ion species | H to U |
| Ion energy | keV - GeV |
| Charge state | 1+ to 56+ |
| Ion flux | 109 - 1012cm-2s-1 |
CIMAP FIB:
| Parameter | PELIICAEN |
|---|---|
| Ion species | H-Bi (middle charged ions,typ. 19+ for Xe) |
| Energy | 3-30 qkeV |
| Beam currents | fa - nA |
| Resolution | 100 nm spot mode, 25 nm microscopy mode |
| Special features | In situ SEM and AFM/STM |
Photos:
Addresses:
Centre National de la recherche scientifique CNRS
Rue Michel Ange 3
75794 Paris
France
Centre de recherche sur les Ions, les MAtériaux et las Photonique (CIMAP)
Boulevard Henri Becquerel – BP5133
Caen Cedex 5
14070
France